International Journal of Control, Automation, and Systems 2023; 21(12): 4088-4097
https://doi.org/10.1007/s12555-023-0105-4
© The International Journal of Control, Automation, and Systems
In this paper, we propose an auxiliary loss function called an eigen loss to reduce the overfitting of fewshot learning algorithms. The proposed loss function predicts the class of unlabeled query images by measuring the similarity between the query image and reconstructed image constructed from the eigenimages of the support data. The eigen loss is used in a linearly combined form with the existing loss function of few-shot learning models. Experimental results of the eigen loss applied to representative few-shot learning models on widely used datasets (i.e., MiniImageNet, CUB, and TieredImageNet) show that the proposed method yields notable improvements in terms of classification accuracy.
Keywords Eigenimage, few-shot learning, meta-learning, principal component analysis (PCA).
International Journal of Control, Automation, and Systems 2023; 21(12): 4088-4097
Published online December 1, 2023 https://doi.org/10.1007/s12555-023-0105-4
Copyright © The International Journal of Control, Automation, and Systems.
Jonghyun Ko and Wonzoo Chung*
Korea University
In this paper, we propose an auxiliary loss function called an eigen loss to reduce the overfitting of fewshot learning algorithms. The proposed loss function predicts the class of unlabeled query images by measuring the similarity between the query image and reconstructed image constructed from the eigenimages of the support data. The eigen loss is used in a linearly combined form with the existing loss function of few-shot learning models. Experimental results of the eigen loss applied to representative few-shot learning models on widely used datasets (i.e., MiniImageNet, CUB, and TieredImageNet) show that the proposed method yields notable improvements in terms of classification accuracy.
Keywords: Eigenimage, few-shot learning, meta-learning, principal component analysis (PCA).
Vol. 22, No. 12, pp. 3545~3811
Jeonghoon Kwak, Kyon-Mo Yang, Ye Jun Lee, Min-Gyu Kim, and Kap-Ho Seo*
International Journal of Control, Automation, and Systems 2023; 21(11): 3746-3756